Vol.33 (2003), No. 4

Click on the title to see the abstract and more info

Raman gain characterization in standard single mode optical fibres for optical simulation purposes
Paulo S. Andre, Rosario Correia, Luis M. Borghesi Jr, Antonio L.J. Teixeira, Rogerio N. Nogueira, Mario J.N. Lima, Hypolito J. Kalinowski, Ferreira Da Rocha, Joao L. Pinto
pp. 559-573 No PDF file No PDF file in base  
Analysis of the spatial distribution of luminous intensity at the fibre output
Adam Nikolajew, Jan Dorosz
pp. 575-581 No PDF file No PDF file in base  
Scanning electron microscopy examination of telecommunication single mode fiber splices
Jan Hejna, Marek Ratuszek, Jacek Majewski, Zbigniew Zakrzewski
pp. 583-589 No PDF file No PDF file in base  
Selected problems in holographic memory design
Andrzej Andruchow, Aleksander Jaskolka, Eugeniusz Jagoszewski
pp. 591-603 No PDF file No PDF file in base  
Holographic confocal microscope
Irena Antosova, Zdenek Harna
pp. 605-612 No PDF file No PDF file in base  
Investigations of multimode interference structures made by ion exchange in glass
Marek Blahut, Damian Kasprzak
pp. 613-626 No PDF file No PDF file in base  
Accurate interference pattern analysis module of automatic measurement system
Allen J. Whang, Chi-Kuei Chung
pp. 627-634 No PDF file No PDF file in base  
Informational representation of fundamental phenomena in the digital electro-optical imaging devices
Petr Jakubik, Jaroslav Pospisil
pp. 635-648 No PDF file No PDF file in base  
Fluctuation of colliding-enhanced YAG phase-conjugate ring cavity in primary resonator stability
Jun Qu, Weijun Zhang, Xiaoming Gao, Anling Liu, Wei Huang, Shixin Pei, Jie Shao, Yong Yang
pp. 649-653 No PDF file No PDF file in base  
Absolute photonic band gap from 2D square compound lattices
Fang Yuntuan, Shen Tinggen, Tan Xilin
pp. 655-660 No PDF file No PDF file in base  
Structural, optical and electrical characterization of Co-Pd doped TiO2 semiconducting thin films sputtered on silicon
Jaroslaw Domaradzki, Eugeniusz Prociow, Danuta Kaczmarek, Tadeusz Berlicki, Robert Kudrawiec, Jan Misiewicz, Witold Mielcarek
pp. 661-668 No PDF file No PDF file in base  
Thermal characterization of micro-devices with far and near field microscopy
Roman F. Szeloch, Teodor P. Gotszalk, Pawel Janus
pp. 669-676 No PDF file No PDF file in base  
Thin glass mirors for the Pierre Auger Project
Martin Vlcek, Petr Schovanek, Miroslav Palatka, Miroslav Hrabovsky
pp. 689-693 No PDF file No PDF file in base  
Referenceless testing of vortex optical beams
Halina V. Bogatiryova, Christina V. Felde, Peter V. Polyanskii
pp. 695-708 No PDF file No PDF file in base  

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